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1

Time interleaved analog to digital converters: Tutorial 44

Parkey, Charna, Mikhael, Wasfy

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2013

Language:

english

File:

PDF, 922 KB

english, 2013

2

[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs

Parkey, Charna R., Mikhael, Wasfy B, Chester, David B.

Year:

2012

Language:

english

File:

PDF, 241 KB

english, 2012

3

[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Simulink modeling of analog to digital converters for post conversion correction development and evaluation

Parkey, Charna R., Chester, David B., Hunter, Matthew T., Mikhael, Wasfy B.

Year:

2011

Language:

english

File:

PDF, 861 KB

english, 2011

4

Linearized adaptation of non-linear post conversion correction for TIADCs: a behavioral model study

Parkey, Charna R., Mikhael, Wasfy B.

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2015

Language:

english

File:

PDF, 548 KB

english, 2015

5

[IEEE 2011 IEEE AUTOTESTCON - Baltimore, MD, USA (2011.09.12-2011.09.15)] 2011 IEEE AUTOTESTCON - Modeling of jitter and its effects on time interleaved ADC conversion

Parkey, Charna R., Mikhael, Wasfy B., Chester, David B., Hunter, Matthew T.

Year:

2011

Language:

english

File:

PDF, 708 KB

english, 2011

6

[IEEE 2011 IEEE AUTOTESTCON - Baltimore, MD, USA (2011.09.12-2011.09.15)] 2011 IEEE AUTOTESTCON - Analyzing artifacts in the time domain waveform to locate wire faults

Parkey, Charna, Hughes, Craig, Locken, Nicholas

Year:

2011

Language:

english

File:

PDF, 785 KB

english, 2011

7

[IEEE 2012 IEEE AUTOTESTCON - Anaheim, CA, USA (2012.09.10-2012.09.13)] 2012 IEEE AUTOTESTCON Proceedings - Portable field measurement of mobile radio systems, effective radiated power, and receiver sensitivity

Heppt, Kenneth, Hughes, Craig, Parkey, Charna

Year:

2012

Language:

english

File:

PDF, 743 KB

english, 2012

8

[IEEE 2015 IEEE AUTOTESTCON - National Harbor, MD, USA (2015.11.2-2015.11.5)] 2015 IEEE AUTOTESTCON - Cumulant statistical adaptation of non-linear post conversion correction for TI-ADCs

Parkey, Charna R., Mikhael, Wasfy B.

Year:

2015

Language:

english

File:

PDF, 1.33 MB

english, 2015

9

Analyzing artifacts in the time domain waveform to locate wire faults

Parkey, Charna, Hughes, Craig, Locken, Nicholas

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2012

Language:

english

File:

PDF, 3.71 MB

english, 2012

10

[IEEE 2014 IEEE AUTOTEST - St. Louis, MO, USA (2014.9.15-2014.9.18)] 2014 IEEE AUTOTEST - Linearized adaptation of non-linear post conversion correction for TIADCs: A behavorial model study

Parkey, Charna R., Mikhael, Wasfy B.

Year:

2014

Language:

english

File:

PDF, 844 KB

english, 2014

11

[IEEE 2012 IEEE AUTOTESTCON - Anaheim, CA, USA (2012.09.10-2012.09.13)] 2012 IEEE AUTOTESTCON Proceedings - A method of combining intermittent arc fault technologies

Parkey, Charna R., Hughes, Craig, Caulfield, Mike, Masquelier, Michael P.

Year:

2012

Language:

english

File:

PDF, 4.33 MB

english, 2012

12

[IEEE 2014 IEEE AUTOTEST - St. Louis, MO, USA (2014.9.15-2014.9.18)] 2014 IEEE AUTOTEST - Integrated solutions for radio test ATE: Targeting each level of maintenance

Caulfield, Michael S., Parkey, Charna R., Williams, Ian

Year:

2014

Language:

english

File:

PDF, 784 KB

english, 2014

13

[IEEE 2011 IEEE AUTOTESTCON - Baltimore, MD, USA (2011.09.12-2011.09.15)] 2011 IEEE AUTOTESTCON - Rapid development and porting of new waveforms for Synthetic Instrumentation

Parkey, Charna R.

Year:

2011

Language:

english

File:

PDF, 744 KB

english, 2011

14

[IEEE 2011 IEEE AUTOTESTCON - Baltimore, MD, USA (2011.09.12-2011.09.15)] 2011 IEEE AUTOTESTCON - A non-destructive high-voltage low-energy intermittent fault location system

Ballas, Michael, Locken, Nicholas, Parkey, Charna, Hughes, Craig

Year:

2011

Language:

english

File:

PDF, 1.69 MB

english, 2011

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